Material microscopes

Industry & research

Microscopes with confocal, interferometric and Focus Variation scanning methods are highly complex and very accurate measuring systems designed for 3D optical surface analysis. With ever increasing demands for surface quality and characteristic of important components or newly developed materials, accurate contactless measurements are important part of testing or research laboratory.  

Scan technology:
1
LED light source:
Motorization XY:
Yes
Resolution in XY stage:
max. 140 nm
Resolution in Z stage:
max. 0,01 nm
5 Axis measurement:
Yes/No
LED light source:
4x
Motorization XY:
Yes
Resolution in XY stage:
max. 140 nm
Resolution in Z stage:
max. 0,01 nm
5 Axis measurement:
Yes
LED light source:
Motorization XY:
No
Resolution in XY stage:
max. 170 nm
Resolution in Z stage:
max. 1 nm